Institut Charles Sadron Event

Electron microscopy (EM) is an essential tool for structural characterization, allowing us to link the morphology and internal structure of materials at resolutions down to the subatomic level. However, its analytical capability is significantly restricted when applied to soft and biological materials, which are prone to damage from high-energy electron radiation. In this talk, I will present our recent developments in low-dose (S)TEM methods for soft and polymeric materials, particularly carbohydrate-based materials. I will also discuss how to apply these methods to complex biological and bio-derived materials.